| |
From nano to millimeter high resolution and reliable detection
 |  |
3D topography of an anti-
friction ball bearing for
the evaluation of wear, |
light guide plate with height profile measurement, extended depth of field |
| |
Smaller than small: measurements in nanometers
The Axio CSM 700 demonstrates its abilities particularly with the identification and measurement of height differences: it guarantees reliable detection of height information on step heights from approx. 20 nm up to several millimeters.
Height differences in the millimeter range
Even deeply structured surfaces with height differences up to the millimeter range can be reliably analyzed with the Axio CSM 700.
The high-contrast, high-resolution images display a depth of field formerly possible only with a scanning electron microscope. Furthermore, color information is provided with confocal precision.
With semi-transparent materials and multilayer systems, the Axio CSM 700 is able to identify inclusions, interfaces, shrink cavities and inhomogeneities and to perform layer thickness measurements.
Reliably assess the surface quality
The Axio CSM 700 is ideal for inspecting the quality of engineering surfaces, e.g. in precision-machining of metal surfaces in the machine and tool-making industry or the tribological analysis of high-performance ceramic components in the automotive industry.
2D height profiles can also be reliably recorded with the Axio CSM 700. Use the high-resolution microscopic image to decide online where and how you want to record your height profile. Information-rich 3D visualization techniques of the software enable fast qualitative assessment of friction and wear tests made on innovative surfaces.
Comprehensive geometric measurement functions and functional parameters such as bearing ratio, area and volume proportions ensure thorough characterization of the surface texture.
Top | |
|