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Surprisingly wide variety of image analysis techniques
The spectrum ranges from simple distance assessment to 2D and 3D roughness measurement and particle analysis.
Operation: intuitive, efficient, easy
The following functions support and accelerate the capture of 3D image stacks:
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| • | Autofocus: Automatically focus on the surface to be examined –
just one click |
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| • | Autogain: Automatically adjust brightness to the optimum values defined by the illumination intensity and surface reflectivity of the examined object – just one click |
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| • | Height measurements at a very high speed:
Thanks to the use of the innovative Wire-Frame mode, height measurements can be performed at a speed of more than 100 frames per second. |
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To complete a measurement, only the highest and lowest surface points need to be set. You can easily perform these simple steps even if you are not an experienced microscopist.
Measurement functionality
Base your non-contact measurements of distances, (average) line widths, angles, radii, surfaces, volumes, etc. on individual and/or several profiles.
Available profilometry functions include roughness and waviness measurements along lines or surface measurements. The calculation of the appropriate parameters is based on the DIN EN ISO 4287. standard.
Stitching
Using a motorized stage, record image stack arrays manually or automatically to capture large object fields.
Overlaying the image fields of individual stacks enables precise correlation using modern software algorithms within the array. This produces a clear error-free image of the extended object field.
Of course, the above measuring functions are also available for stacks extended in this way.
Layout function
Finally, interactively enter the respective measuring results in different formats and save them as measurement reports.
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Report Example
Surface after 3 days in machine
true color confocal image and roughness values |
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